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High-Performance Bit Error Rate Tester

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SL3000A Pro Series High-Performance Bit Error Rate Tester
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The SL3000A Pro series High-Performance Bit Error Rate Tester features excellent performance metrics, a rich set of functions, flexible option configurations, and an extremely high level of integration. It provides powerful performance and a wealth of advanced features for the pre-research, design, and production testing of high-speed serial circuit products. The BERT can test and analyze the bit error rate in high-speed wired communication systems and is primarily used to evaluate the performance of electronic channels. It is an essential instrument for the R&D and testing of high-speed communication hardware circuits, widely used in universities, research institutes, communication equipment R&D, and aerospace research fields.

Applications:High-Speed Interconnect/Laser Communication/Coherent Optics/High-Speed Chip SERDES/FPGA/High-Speed Serial Bus/High-Speed Data Center/Optical Communication/Optical Module
    Features & Benefits:
    • A single chassis supports 8 expandable functional slots for flexible configuration of different modules, supporting up to 32 channels
    • Supports all mainstream NRZ/PAM4 standard and non-standard data rates from 1.25 Gbps~120 Gbps
    • Supports common pseudo-random bit sequences (PRBS7/9/15/23/31, PRBS13Q, PRBS31Q, SSPRQ) and 128-bit advanced custom patterns
    • Supports RJ and SJ injection
    • PPG built-in up to 7 FFE taps, Supports 2.5V differential high-voltage output
    • ED equipped with CDR function and supports automatic equalization
    • ED supports advanced eye diagram and FEC analysis, with adjustable EOJ and PAM4 triple-eye view


As the operating speeds of digital circuits increase, the signal transmission rates on PcBs, connectors, and back.planes are also getting higher, with serial data communication playing a dominant role. Precision-designedhigh-speed interconnects such as ETH/VPX backplanes and high-speed cables, designed to the strictest perfor.mance standards, have become crucial in the current context of widespread demand for high-speed signals innational defense. The backplane is the communication backbone in embedded systems and must be designedaccording to strict signal integrity standards to ensure timely and accurate data transmission between moduleswithin the system. As systems move towards supporting higher serial bit rates like 100G-baseKR4/CR4 and400G-base KR4/CR4 Ethernet, high signal integrity is essential for achieving fail-safe operation. To meet the perfor.mance expectations of high-speed transmission, especially for high-speed receivers, receiver tolerance testing iscrucial.


• A single module supports the configuration of 1-4 channels of Pattern Generator (PPG) and Error Detector (ED).
• A single chassis supports 8 expandable functional slots for flexible configuration of different modules, supporting up to 32 channels.
• Each channel supports rates from 1.25Gbps up to 120Gbps.
• Supports all mainstream NRZ/PAM4 rates and various non-standard rates, with different options available for future rate expansion and upgrades.

• A high-speed signal integrity test system with customizable fixtures, matching cables, adapters, etc., to meet the testing needs of different scenarios, creating specialized test tools to make testing more professional and simpler




• Supports NRZ and PAM4 encoded signaling formats.
• PPG supports rich injection of low-frequency and high-frequency jitter.
• Simulates complex real-world environments:
- Sinusoidal Jitter (SJ1/SJ2) injection
- Random Jitter (RJ) injection
• PPG has a built-in FFE with up to 7 taps, providing flexible pre-distortion settings for channel compensation.
• PPG supports high-voltage differential output up to 2.5V.
• Supports phase/skew adjustment between multiple PPG cards with up to picosecond resolution.
• Supports multiple random patterns and custom patterns.
• PRBS random patterns, high/medium/low-frequency clock patterns.
• 128-bit user-defined patterns.
• Supports adjustment of the three eye heights for PAM4.
• The receiver (ED) supports advanced automatic equalization to easily meet various complex test environments.
• The receiver (ED) has a built-in Clock Data Recovery (CDR) function, eliminating the need for an external clock input.



For more details, please refer to the datasheet.


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